Program

█ Regular Sessions	█ Special Sessions	█ IP Sessions
█ Plenary Events	█ TPC Events

Sunday, April 24th, 2016
08:30-12:00	Morning Tutorials Tutorial #1: Diagnosis Driven Yield Analysis Tutorial #2: Testing of Automotive ICs – Testability and Advanced Features
01:30-17:00	Afternoon Tutorials Tutorial #3: Understanding the Unique Fallout From Cell Aware Tests Tutorial #4: Testing of Automotive ICs – Engineering and Production
Monday, April 25th, 2016
07:30-08:30	Registration & Breakfast
08:30-10:30	Plenary session  Welcome Message Yiorgos Makris (U.T. Dallas), General Chair Program Introduction Lorena Anghel (University of Grenoble Alpes, TIMA Laboratory), and Srivaths Ravi, (Texas Instruments), Program Co-Chair Opening keynote Challenges and Opportunities in Electrical Characterization and Test for 14nm and Below ( Andrzej J. Strojwas, Chief Technologist, PDF Solutions, Inc. and Keithley Professor Carnegie Mellon University ) Keynote tribute to Professor Edward J. McCluskey Digital Revolution over Generations (Professor Jacob Abraham, Cockrell Family Regents Chair in Engineering, University of Texas at Austin – Dr. Hong Hao, Senior Vice President, Samsung – Mr. Max Shulaker, Stanford University)
10:30-11:10	Break
11:10-12:10	1A – Analog, Mixed and RF Testing I	1B – Delay and Performance Testing	1C – Memory Testing
12:10-13:40	Lunch Break
13:40-14:40	2A – Test Quality and Yield Optimization	2B – New Topic: Active polymers for biomedical micro devices and microfluidic systems	2C – ATPG is no longer the D Algorithm you Studied at School
14:40-15:00	Break
15:00-16:00	3A – Test Applications: Hardware Security and Microfluidic BioChips	3B – Hot Topic: Post Production Tuning of RF Circuits: Designers’ Perspective	3C – Will Cell-aware Testing Steer Us to Zero Defects
16:00-16:20	Break
16:20-17:50	4A – Panel: Test Opportunity for Secure Hardware	4B – Panel: Data Analytics in Semiconductor Manufacturing	4C – Hot Topic: Thermal issues in test: an overview of the significant aspects and industrial practice
17:50-17:55
17:55-19:50	TPC Meeting (by invitation only)
19:50-20:00
20:00-21:30	Cisco-Sponsored Wine-&-Cheese Plenary Evening Panel What is the next big thing for test? What are you doing about it?”

Tuesday, April 26th, 2016
07:30-08:30	Registration & Breakfast
08:30-09:30	5A – ATPG and TEST Compression	5B – Analog, Mixed and RF Testing II	5C – Automotive Track 1: Automotive Test Challenges
09:30-09:50	Break
09:50-10:50	6A – Embedded Memory Testing	6B – Hot Topic: Security Validation in IOT space	6C – Automotive Track 2: Adapting Traditional Methods for New Challenges
10:50-11:10	Break
11:10-12:10	7A – Low Power IC Test	7B – Embedded Tutorial: Emerging Technology for Hardware Security	7C – Automotive Track 3: Automotive Quality Challenges
12:10-13:30	Lunch Break
13:30-15:00	8A: Hot Topic : Test Implications and Challenges in Near Threshold Computing	8B – Special Session: E.J. McCluskey Doctoral Thesis Competition (Presentations & Posters)	8C – Innovation in Board Testing
15:00-15:30	Break
15:30-22:00	Social Program

Wednesday, April 27th, 2016
07:30-08:30	Registration & Breakfast
08:30-09:30	9A – Analog, Mixed and RF Testing III	9B – Reliability	9C – Emerging Data Analysis for Accelerated Silicon Learning
09:30-09:50	Break
09:50-10:50	10A – Memory Testing and Yield Enhancements	10B – HoT Topic: Test and Fault Tolerance in Approximate Computing	10C – 3D Test and Reliability Challenges
10:50-11:10	Break
11:10-12:10	11A – SoC Testing	11B – Panel: System Validation and Silicon Debug – Is Standardization Possible?	11C – A Case Study on IEEE 1687 implementation
12:10-13:40	Lunch Break
13:45-15:10	12A – Fault modeling, Simulation and BIST	12B – Managing lifetime in Manycore Systems	12C – Town Hall Meeting