Room: Florentine I
Moderator: Peter Maxwell (OnSemi, USA)

• Consistency in Wafer Based Outlier Screening
  Sebastian SIATKOWSKI, Chuanhe SHAN (University of California, Santa Barbara), Li-C. WANG (UC Santa Barbara), Nik SUMIKAWA (Freescale Semiconductor), W. Robert Daasch (Portland State University) John M. Carulli Jr. (GlobalFoundries) (Best paper nominee)
• Predicting Vt Mean and Variance from Parallel Id Measurement with Model-Fitting Technique
  Chih-Ying TSAI, Kao-Chi LEE, Chien-Hsueh LIN (National Chiao Tung University), Sung_Chu YU, Wen-Rong LIAU, Alex HOU (United Microelectronics Corporation), Ying-Yen CHEN, Chun-Yi KUO, Jih-Nung LEE (Realtek Semiconductor Corp.), Mango CHAO (National Chiao Tung University)
• Yield Optimization of High Reliabilty Automotive NVMs Without Reducing Quality
  Pete SARSON, Friedrich LEISENBERGER, Gregor SCHATZBERGER (ams AG)