Room: Florentine I
Moderator: Bruce Querbach (Intel, USA)

• A Post-Package Repair Scheme for Aging Errors in DRAMs
  Dae-Hyun KIM, Linda MILOR (Georgia Institute of Technology)
• Fault Modeling and Testing of Resistive Nonvolatile-8T SRAMs
  JIN-FU LI, Yong-Xiao CHEN (National Central University), Yu-Ting LI (National central University)
• SRAM yield-per-area optimization under spatially-correlated process variation
  Jizhe ZHANG, Sandeep GUPTA (University of Southern California)