Room: Florentine I
Moderator: Arani Sinha, Intel

• Lateral Coupling Faults in Multiported Register Files and Methods for their Testing
  Michael LOHMILLER (Intel Corp), Dilip BHAVSAR (Self employed), pankaj.pant@intel.com PANT (Intel Corp)
• Process Variation Oriented Delay Testing of SRAMs
  Xuan ZUO, Sandeep GUPTA (University of Southern California)
• Short Burst Software Transparent On-line MBIST
  Alan BECKER (ARM)