Room:  Florentine III
Organizer: Yervant Zorian, Synopsys
Moderator: Amit Majumdar, Xilinx

• FDSOI Memories: a non-disruptive technology for Test and Repair
  Arnaud Wenzel (ST Microelectronics, FR)
• Innovative Test and Repair for FinFET memories
  Gurgen Harutyunyan, Karen Darwinian (Synopsys)
• Efficient BIST and Repair Scheme For “Memory-Dense” Complex Networking ASIC
  Ajay Thadhlani (Bearfoot Networks)