IEEE VLSI Test Symposium 2016

April 25-27, 2016 Caesars Palace, Las Vegas, NV, USA

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Evening Panel

Posted on March 28, 2016 by admin

What’s the next big thing for test? What’re you doing about it?

Industry

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Robert C. Aitken (ARM, USA).

Paul G Ryan - Formal Head Shot copy

Paul G Ryan (Intel, USA).

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Jonathan Chang (TSMC).

yervant-zorian

Dr. Yervant Zorian (Synopsys)

Academics

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Jacob Abraham (U Texas at Austin, USA)

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Janak Patel (U Illinois at Urbana Champaign, USA)

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Hans-Joachim Wunderlich (U Stuttgart, Germany).

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