Tutorials – Sunday, April 24, 2016

VTS’16 is offering 4 half-day TTEP tutorials for which a separate registration fee is required. Attendees who register for the tutorials may select one of the two morning options and one of the two afternoon options. Registration includes a hard copy of the tutorial material, breakfast, coffee breaks and lunch. The four tutorials are listed below:

Morning Tutorials (8:30a.m. – 12:00 p.m.)

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Tutorial #1: Diagnosis Driven Yield Analysis

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Instructors: Yu Huang, Wu Yang (Mentor Graphics)

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Tutorial #2: Testing of Automotive ICs – Testability and Advanced Features

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Instructors: Edgar Ernesto Sanchez Sanchez (Politecnico di Torino), Davide Appello (ST Microelectronics), Oscar Ballan (Xilinx)

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Afternoon Tutorials (1:30 p.m. – 5:00 p.m.)

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Tutorial #3: Understanding the Unique Fallout From Cell Aware Tests

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Tutorial #4: Testing of Automotive ICs – Engineering and Production

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Instructors: Edgar Ernesto Sanchez Sanchez (Politecnico di Torino), Davide Appello (ST Microelectronics), Oscar Ballan (Xilinx)