Room: Florentine I
Organizer: Mark Tehranipoor, UFL
Moderator: Swarup Bhunia, University of Florida

Abstract: Securing hardware in critical applications has received significant attention from the community over the past decade while equal attention has been given to the quality and reliability of integrated circuits and systems used in such applications over the past two decades. However, we are at a crossroad where achieving high levels of security, testability, diagnoseability, and debug seems to becoming a major challenge for which one requires high controllability and observability where the other requires high confidentiality and integrity. This panel discusses the attacks on such systems, presents industry and academic solutions in addressing this major problem, and suggests new challenges to investigate in domain of secure testable hardware.

• Panel Members:
  • Yervant Zorian (Synosys)
  • Saverio Fazzari (Booz Allen Hamilton)
  • Michael Chen (Mentor graphics)
  • Bill Eklow (Cisco)
  • Mark Tehranipoor (University of Florida)
  • Robert van Rijsinge, Manager DfX & Test, BU Automotive NXP