Room: Florentine III
Organizer: Mike Ricchetti (Synopsys)
Moderator: Mike Ricchetti (Synopsys) 

• TEMS extensions for characterization
  Keith Thomas (Teradyne, USA)

  Abstract: The Test Event Messaging System Working Group (TEMS) section of Collaborative Alliance for Semiconductor Test, under the auspices of SEMI, has developed a method for real-time data streaming of data from the test cell. Using this new open-source standard, Teradyne in collaboration with Galaxy Semi, has developed tools including a real-time data viewer and analysis system for semiconductor test. In this presentation, we will describe the motivation for extending the standard from OEE and Test Data to characterization data. We will describe the kinds of data included in this standardization effort and why we feel it should be part characterization database. The intent is that the characterization extensions will be an appendix to the standard when TEMS is ratified.

• Galaxy approach for characterization
  Steve McDowall (Galaxysemi, USA)

  Abstract: Characterization is a key phase of the NPI (New Product Introduction) process, and often includes corner case analysis of early device samples, test limit setting, gage R&R and shift analysis (over time and temperature). While much of this analysis can be performed offline on datalog files, engineers can achieve significant productivity gains when key analytics are performed in real time while they are in front of the tester. We will describe the combination of real-time and offline analysis that contribute to faster NPI.

• Characterization flow with ATE
  Marc Hutner (Teradyne Inc., USA)

  Abstract: The time between device characterization and product ramp has been compressing significantly over the last decade. Characterization and Test are no longer isolated activities. Leveraging the TEMS extensions, we will discuss how the characterization flow changes for this new data collection paradigm.