As community, VTS never stop working. In fact, each year, VTS recognizes the organizers and presenters of the Best Paper Award, Best Innovative Practices Session and the Best Special Session at the previous year’s symposium. The selection is based entirely on audience feedback, as recorded on the attendee feedback forms.
And now it is the time to announce the Awards!
For VTS 2017, the Best Paper Award goes to:
2.A.2: Methodology of Generating Dual-Cell-Aware Tests
Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien (National Chiao Tung University),
Ying-Yen Chen, Max Wu, Jih-Nung Lee (Realtek Semiconductor Corp.),
Mango Chao (National Chiao Tung University)
The VTS 2017 Best Paper Award selection committee was composed by:
- TM Mak, Independant
- Salvador Mir, TIMA Laboratory
- Arani Sinha, Intel
VTS extends special thanks to these individuals for reviewing the papers and offering invaluable comments.
For VTS 2017, the Best Innovative Practices Session Award goes to:
IP Session 4.C: Data Analytics in Test
Organizer: Suriya Natarajan (Intel Corporation)
Moderator: Abhijit Sathaye (Intel Corporation)
- Big Data Analytics Engines for End-to-End Supply Chain and Quality Control
Thomas Harper, Paul Simon (Qualtera) - Data Mining of Defective Parts Investigation in Test
Rahima Mohammed (Intel Corporation) - Intelligent Data Driven Test Eco-system
Amit Nahar (Texas Instruments)
For VTS 2017, the Best Special Session Award goes to:
Panel Session 8.A: Hot Topic: Future Extensions of IEEE Test Standards
Organizer: Jennifer Dworak (Southern Methodist University)
Moderator: Yu Huang (Mentor Graphics)
- From 1687 to 1687.1
Martin Keim (Mentor Graphics) - Extending IEEE 1687 for Use on Analog / Mixed-Signal Chips
Jeff Rearick (AMD) - IEEE Std P1838: DFT Up and Down the Stack
Adam Cron (Synopsys)