The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world’s leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2018 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Half-day Tutorials, the Innovative Practices Track, and all Students activities.

Full registration includes breakfasts, lunches, coffee breaks, social event, and electronic distribution of the symposium proceedings.

Student registration includes all of the above except the social event.

Discounted advance registration prices are valid until 04/10/18.  Cancellations are allowed until 04/10/18 at an administrative fee of $75. Substitutions are allowed until 04/15/18, at no cost. For either of the above or any other registration questions, please contact the registration chair, .

VTS’18 Registration Fees

Conference registration Advance
(by April 10, 2018)
(After April 10, 2018)
IEEE Member Fee $650.00 $770.00
IEEE Non-Member Fee $795.00 $925.00
IEEE Student Member Fee $350.00 $425.00
Student IEEE Non-Member Fee $500.00 $600.00
IEEE Life Member Fee $350.00 $425.00
Tutorials  Advance
(by April 10, 2018)
(After April 10, 2018)
FULL DAY IEEE Member, Student or Life Member $300.00 $350.00
FULL DAY IEEE Non-Member $360.00 $420.00
HALF DAY IEEE Member, Student or Life Member $200.00 $270.00
HALF DAY  IEEE Non-Member $240.00 $330.00
Other Advance
(by April 10, 2018)
(After April 10, 2018)
Additional Social Event Tickets $125.00 $125.00
Additional Lunch Tickets (Daily) $65.00 $65.00