Presenters: Yu Huang and Gaurav Veda (Mentor, A Siemens Business)

Abstract:

In this tutorial, we will start by covering the basics of machine learning. We will proceed to give a brief overview of the new and exciting field of deep learning. We will show how easy it is to try using machine learning and deep learning, thanks to powerful, free libraries. After offering the required background in machine learning, we will review several important papers in the field of DFT, diagnosis, yield learning, and root cause analysis, which use machine learning algorithms for solving various problems. Finally, we will propose future research directions in the area of testing, where we think machine learning (especially deep learning) can make a big impact.

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