Organizers:
Edgar Ernesto Sanchez Sanchez (Politecnico di Torino)
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and microprocessor functional testing.
Davide Appello (STMicroelectronics)
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Giuseppe Rumi (ST Microelectronics)
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electronic engineering at Politecnico di Milano and a PhD in EDA from Cefriel in Milan. He occupied several positions on test and testability for products developed for several application domains. In the last 15 years he fully focused on automotive products by bringing from design to high volume production more than 30 products.
He is bringing the experience of collaborations with multiple players in the automotive domain and beyond, including several tiers 1 a tier 2 customers and IC manufacturers.
Oscar Ballan (Xilinx)
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He is currently part of the US technical committee for the revision of the ISO-26262 standard, and is author or co-author of 5 publications related to the fault grading of integrated circuits.
He received a degree in electronic engineering from the “Universita’ di Padova” in Italy and an MBA from Hult International Business school, London campus,UK.
Summary
Electronics content in the car is constantly growing. On top of traditional applications for engine control, transmission, braking/steering, passive safety, body and dashboard also multimedia, advanced driver assistance and car2X segments are rapidly growing. The stability and extended duration in manufacturing of these components make them very attractive for the industry. Extreme product quality achieved with very low cost is the key challenge. The tutorial covers a broad range of topics which are defining the testability and advanced topics like testing of safety critical and secure devices. Relevant industrial cases will be proposed to participants.