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The list of accepted papers is now published in the “early program” section.
Dear Colleagues,
This year marks the 35th anniversary of the IEEE VLSI Test Symposium (VTS’17) and we will be convening in Las Vegas, Nevada on April 9 – 12, 2017.
The IEEE VLSI Test Symposium is a flagship annual international event sponsored by the IEEE Test Technology Technical Council and IEEE Computer Society. Each year it attracts more than 250 leading design and test professionals from over 25 countries around the world. Most major companies, research laboratories, and universities active in the field of VLSI test, validation, reliability, and security are represented at the Symposium.
On behalf of the Organizing Committee, we would like to invite your company to participate in the Corporate Supporters Program of VTS’17.
The VTS submission deadline is now approaching. The deadline for all submissions is:
Be a part of the VTS conference 2017, Submit your paper
We are pleased to announce that the abstract submission for the VTS 2017 conference is now open.
Be a part of the VTS conference 2017, Submit your paper
The deadline for submitting your abstracts is October 14th 2016.