The list of accepted papers is now published in the “early program” section.

Dear Colleagues,

This year marks the 35^th anniversary of the IEEE VLSI Test Symposium (VTS’17) and we will be convening in Las Vegas, Nevada on April 9 – 12, 2017.

The IEEE VLSI Test Symposium is a flagship annual international event sponsored by the IEEE Test Technology Technical Council and IEEE Computer Society. Each year it attracts more than 250 leading design and test professionals from over 25 countries around the world. Most major companies, research laboratories, and universities active in the field of VLSI test, validation, reliability, and security are represented at the Symposium.

On behalf of the Organizing Committee, we would like to invite your company to participate in the Corporate Supporters Program of VTS’17.

Continue reading Corporate Supporters Program Invitation →

The paper submission phase is now closed.

The VTS submission deadline is now approaching.  The deadline for all submissions is:

• Oct. 14th, 2016 – Abstract uploaded into the paper submission system (and current drafts of the paper)
• Oct. 28st, 2016 – Hard deadline for the final version of the paper.

Be a part of the VTS conference 2017, Submit your paper

We are pleased to announce that the abstract submission for the VTS 2017 conference is  now open.

Be a part of the VTS conference 2017, Submit your paper

The deadline for submitting your abstracts is October 14th 2016.