Registration

The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world’s leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2023 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Special Sessions, and all Students activities.

For any registration questions, please contact the registration chair, Ioana Vatajelu, or Program chairs Sule Ozev and Jennifer Dworak

Important Author Information

At least one author per paper must be registered as an AUTHOR at the full Member / Non-Member registration rate, regardless of whether or not they are students.

The author registration deadline is 31 March, 2023.

  • Each Author Registration is valid for ONE paper. 

For questions regarding paper submissions, please contact Sule Ozev at SuleOzev@asu.edu and Jennifer Dworak at jdworak@mail.smu.edu.

Can’t attend the VTS 2023 in-person? You can attend the conference virtually for a registration fee of $120. Please use VTS2023-41 while registering. You will receive the three zoom links (for Sessions A, B, C) before the conference.
Click here to start the registration process.

 

If you require an offline (bank transfer) payment, please send an email to the Registration chair.

VTS’23 Registration Fees
Conference Registration – Author Fee
IEEE Member $700
Non-Member $850
IEEE Student Member $700
Student Non-Member $850
IEEE Life Member $700
Conference Registration Fee
IEEE Member $700 ($850 after March 31)
Non-Member $850 ($1,050 after March 31)
IEEE Student Member $500 ($600 after March 31)
Student Non-Member $600 ($700 after March 31)
IEEE Life Member $400.00 ($500 after March 31)

More information on registration fees here.