The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems.
The symposium will take place on April 24-26, 2023, at the Hyatt Regency Mission Bay Spa & Marina, 1441 Quivira Road, San Diego, CA, USA.
The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
You are invited to participate and submit your contributions to VTS’23. The areas of interest include (but are not limited to) the following topics:
VTS Topics
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New Hot Topics
VTS puts particular emphasis on enlarging its scope soliciting submissions on aspects on the following hot topics:
- Test, Reliability & Security of AI and Neuromorphic Devices
- Machine Learning for Test
- Test & Reliability of Machine Learning Systems
- Test, Reliability & Security in Quantum Computing
- Silent Data Corruption
General Chairs
Program Chairs
