The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world’s leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2021 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Half-day Tutorials, the Innovative Practices Track, and all Students activities.

For any registration questions, please contact the registration chair, Ke Huang.

To begin the registration process, please use the following link:

https://whova.com/portal/registration/ivts_202104/

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VTS’21 Virtual Event Registration Fees
Virtual conference registration
IEEE Member Fee	$50.00
IEEE Non-Member Fee	$75.00
IEEE Student Member Fee	$35.00
Student IEEE Non-Member Fee	$35.00
IEEE Life Member Fee	$30.00