Registration

The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world’s leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2017 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Half-day Tutorials, and the Innovative Practices Track.

Full registration includes breakfasts, lunches, coffee breaks, social event, and electronic distribution of the symposium proceedings.

Student registration includes all of the above except the social event.

Discounted advance registration prices are valid until April 3rd, 2017 at  midnight PST.  Cancellations are allowed until March 27th, 2017 at an administrative fee of $75. Substitutions are allowed until April 7th, 2017 at no cost. For either of the above or any other registration questions, please contact the registration chair, Chintan Patel.

VTS’17 Registration Fees

Conference registration Advance
(by April 3rd, 2017)
Late/On-Site
(After April 3rd, 2017)
IEEE Member Fee $650.00 $770.00
IEEE Non-Member Fee $780.00 $925.00
IEEE Student Member Fee $350.00 $425.00
Student IEEE Non-Member Fee $500.00 $600.00
IEEE Life Member Fee $350.00 $425.00
SINGLE tutorials (morning OR afternoon)  Advance
(by April 3rd, 2017)
Late/On-Site
(After April 3rd, 2017)
IEEE Member, Student or Life Member $200.00 $250.00
IEEE Non-Member $240.00 $300.00
TWO tutorials (morning AND afternoon) Advance
(by April 3rd, 2017)
 Late/On-Site
(After April 3rd, 2017)
 IEEE Member, Student or Life Member $300 $375
 IEEE Non-Member $360 $450
Other Advance
(by April 3rd, 2017)
Late/On-Site
(After April 3rd, 2017)
Additional Social Event Tickets $125.00 $125.00
Additional Lunch Tickets (Daily) $65.00 $65.00

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