Security and resiliency of non-volatile memories: How test can help?

Speaker: Swaroop Ghosh (Penn State University)

Abstract: At the end of Silicon roadmap, several emerging non-volatile memory (NVM) technologies have surfaced. Due to plentitude of features such as, non-volatility, capability to create new computation paradigms, scalability and low-power, these NVMs have created substantial excitement in the design community. This talk will uncover the hidden vulnerabilities present in some of these promising technologies such as, Spin-Transfer Torque RAM (STTRAM) and Resistive RAM (ReRAM) that can be harmful for the memory resiliency and security. We will use simulation and experimental data to demonstrate NVM’s sensitivity to magnetic field and temperature as potential sources of integrity loss and presence of side channels as harmful source of information leakage. Role of test in assuring high degree of resiliency and memory integrity will also be discussed.

Spintoronics Memories: Past, Present and Future

Speaker: Tomishima Shigeki (Intel Labs)

Abstract: Magnetic Memory (MRAM) has been studied for long time as SRAM/DRAM replacement candidate and the nonvolatile universal memory in the academia and industry. Even now, the magnetic materials and spintronics physics are still under the research and the development, then new papers and proposals continues being published every year. This presentation summarizes the features of the spintoronics memories in the past, the current trend with circuits, test and architecture techniques and conclude by the future projection.

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