Speaker: Yervant Zorian (Synopsys)

Abstract: Given today’s fast growing automotive semiconductor industry, this tutorial will discuss the implications of automotive test, reliability and functional safety requirements on all aspects of the SOC lifecycle: design, silicon bring-up, volume production, and particularly in-system functional safety. Today’s automotive safety critical chips need multiple in-system self-test modes, such as power-on self-test and repair, periodic in-field self-test, advanced error correction, etc. This tutorial will cover these specific in-system modes and the benefits of selecting ISO 26262 certified solutions to ensure standardized functional safety requirements, while accelerating time to market for automotive SOCs.

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