Speaker: Stephen Sunter (Mentor Graphics)

Abstract: the lack of automated analog DFT means that analog circuitry accounts for the vast majority of failures in today’s automotive mixed-signal ICs.  This tutorial strives to improve this situation.  We first review trends in ad hoc DFT and fault simulation, IEEE DFT standards 1149.1, .4, .6, .7, .8, P1149.10, and 1687, and the advent of ISO 26262.  The trend analysis concludes with a review of BIST techniques for ADC/DAC, PLL, SerDes/DDR, and random analog.  Next, seven essential principles of practical analog BIST are presented that include, for instance, addition, subtraction, and specification-based structural test.  Lastly, we discuss practical DFT techniques, ranging from quicker analog defect coverage/tolerance simulation and DFT simplification, to oversampling and undersampling methods that greatly improve range, resolution, and reusability; concluding with an automatable general mixed-signal DFT strategy being developed by engineers from a dozen companies for a future IEEE standard.

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