Automotive IC Testing with BOST Approach

Speakers: Ryoji Shiota (Socionext), Haruo Kobayashi (Gunma University)

Abstract: This talk will introduce testing technologies of automotive application ICs for information and entertainment produced by Socionext Inc. Especially testing technologies using BOST developed with Gunma University will be explained.

Automotive Alternative Test

Speakers: Peter Sarson (ams AG), Constantinos Xanthopoulos (UTDallas)

Abstract: In recent years, due to the extensive interconnectability of many modern electronic devices the use of RF modules has been significantly increased. In an effort to reduce the cost of fabricating these devices, manufacturers primarily focus on decreasing the long testing times that are usually required for achieving high yields. For this to be accomplished a common practice is to replace the expensive RF test measurements with faster DC based measurements. In this work we present a machine learning approach for identifying the RF measurements that can be replaced as well as their DC counterparts which will be used for determining the test outcome. Effectiveness of the proposed method is demonstrated on a large number of RF devices for the automotive industry.

Test methodologies to minimize test cost for Automotive / Safety devices

Speaker: Santosh Kavalur (Texas Instruments)

Abstract: Customers in Automotive / Safety application space demand very high quality of devices. Testing for these high quality of devices usually means large test cost (high test time, yield loss etc.). By implementing innovative methodologies highlighted in this presentation we can keep test cost under control while delivering quality devices. This presentation will explain various tools that we can use to control test cost during pre-silicon, validation and characterization, release to production, production ramp and post silicon test phases. We will present details of the best practices and lessons learnt during our experience in delivering high quality Automotive / Safety devices.

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