Adapting IEEE 1687 PDL for Writing Analog Tests

Speaker: Jeff Rearick (AMD)

Abstract: A use case of the new analog test access standard will be demonstrated with an example of how PDL will be used, this will be beneficial to Automotive IC’s for increasing test coverage.

Testing of mixed signal automotive circuits: do we guarantee the spec or do we catch defects?

Speaker: Wim Dobbelaere (ONSemi)

Abstract: The growing number of chips in automotive applications has created an increasing urge to avoid electronic failures in the field. Automotive semiconductor manufacturers traditionally test circuits in a functional way, guaranteeing the IC performance by sequentially testing for all the contractually agreed spec parameters. This approach has resulted in long development times, long test times and a moderate quality. The advent of analog defect automation tools has demonstrated that the spec tests have a poor defect coverage and are at the same time highly redundant. Recent research in the field of IC testing has led to the development of new defect-oriented techniques that allow to improve the actual fault coverage of the analog circuits.  In this paper we will assess how the ideal automotive test program should look like: do we guarantee the spec or do we catch defects?

Meeting quality for Automotive Application with IO interfaces

Speaker: Salem Abdennadher (Intel Corporation)

Abstract: With Analog and High Speed IO content in Automotive products increasing, their test complexity on the rise and process shrink and scaling causing variation and marginal circuits there is an increase in defect occurrence (DPM), number of stepping, product delays, and customers returns. Delivering architecture, design and DFT capabilities to eliminate Analog, Mixed Signal and High Speed IO circuits’ risks at-source is a critical element of a strategic upstream solutions for Automotive Quality.
This presentation will present effective Outgoing DPM and Infant Mortality DPM Planning for Automotive and impact on high speed IO IP. We will also present the new needed DFx requirements for HSIO IP’s to meet automotive standards and the whole paradigm change of IP reuse.

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