The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world’s leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2019 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Half-day Tutorials, the Innovative Practices Track, and all Students activities.

Full registration includes breakfasts, lunches, coffee breaks, social event, and electronic distribution of the symposium proceedings.

Student registration includes all of the above except the social event.

Discounted advance registration prices are valid until April 15, 2019. Cancellations are allowed until April 15, 2019 at an administrative fee of $75. Substitutions are allowed until April 20, 2019, at no cost. For either of the above or any other registration questions, please contact the registration chair, Ke Huang.