Doctoral Thesis Award

TTTC’s E. J. McCluskey Best Doctoral Thesis 2019 Award Contest

Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2019 TTTC’s Doctoral Thesis Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology.

TTTC’s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor.

The contest is held in two stages: semi-finals and finals.

In 2019, semi-finals will be held at the IEEE VLSI Test Symposium (VTS), the IEEE European Test Symposium (ETS), the IEEE Latin American Test Symposium (LATS) and the IEEE Asian Test Symposium (ATS). At each semi-final, a jury composed of industrial experts will determine the winner, and the four winners will compete against each other in the finals, held at the International Test Conference (ITC) 2019.

VTS 2019 Semifinalists:

  • Session 8B:
    1. Tao Chen (Iowa State University), Advisor: Dr. Degang Chen
      Thesis title: Built-in Self-Test and Self-Calibration for Analog and Mixed Signal Circuits
    2. Tamzidul Hoque (University of Florida), Advisor: Dr. Swarup Bhunia
      Thesis title: IP Trust Assurance through Design and Runtime Solutions
    3. Yingdi Liu (University of Iowa), Advisor: Dr. Sudhakar M. Reddy
      Thesis title: Design for Test Methods to Reduce Test Set Size
    4. Soumya Mittal (Carnegie Mellon University) , Advisor: Dr. Shawn Blanton
      Thesis title: Learning Enhanced Diagnosis of Logic Circuit Failures
    5. Yue Tian (University of Iowa), Advisor: Dr. Sudhakar M. Reddy
      Thesis title: On improving Estimation of Root Cause Distribution of Volume Diagnosis
  • Session 9B:
    1. Grigor Tshagharyan (Yerevan State University, Armenia), Advisor: Dr. Gurgen Harutyunyan
      Thesis title: Efficient Test Solutions for Nano-Scale Memory Devices
    2. Constantinos Xanthopoulos (The University of Texas at Dallas), Advisor: Dr. Yiorgos Makris
      Thesis title: Applications of Machine Learning in Test Cost Reduction and Quality Improvement
    3. Monir Zaman (The University of Texas at Dallas), Advisor: Dr. Yiorgos Makris
      Thesis title: Performance Locking: A Novel Approach Towards Hardware Security
    4. Fanchen Zhang (Southern Methodist University), Advisor: Dr. Jennifer Dworak
      Thesis title: Cell-Aware Fault Analysis and Test Set Optimization in Digital Integrated Circuits

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