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GENERAL INFO
THE SYMPOSIUM
PRACTICAL INFO
PROGRAM
SUBMISSIONS
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Graduate Student Activities |
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The TTTC Student Activities Committee is organizing two activities aiming to provide graduate students
with an opportunity to disseminate their research and obtain visibility in the international test community.
More...
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VTS - May 1st - May 5th, 2011 |
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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2011. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
PROGRAM CHAIR
Claude Thibeault
École de Technologie supérieure
claude.thibeault@etsmtl.ca
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GENERAL CHAIR
Cecilia Metra
DEIS University of Bologna
cecilia.metra@unibo.it
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NEWS |
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Tutorials: the two tutorials are canceled
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Presentation Information: final presentation submission deadline is April 24th, 2011.
Click here for more details.
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Corporate Supporters |
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* Logo of each sponsor is owned by the sponsoring company
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VTS Topics |
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Major topics include, but are not limited to:
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Analog, Mixed-Signal & RF Test
ATPG & Compression
ATE Architecture & Software
Board & System Test
Built-In Self-Test (BIST)
Current Based Test
Defect/Fault Tolerance & Self-Repair
Delay & Performance Test
Design for Testability (DFT)
Design Verification/Validation
Diagnosis and Debug
Embedded System and Microsystems Test
Embedded Test Methods
Emerging Technologies Test
FPGA Test
Fault Modeling and Simulation
Infrastructure IP
Low-Power IC Test
MEMS And Sensor Test
Memory Test and Repair
On-Line Test
Power Issues in Test
System-on-Chip (SOC) Test
System-in-Package Test
Standards
Test Economics
Thermal Test
Test of Biomedical Devices
Test of High-Speed I/O
Test Quality and Reliability
Test Resource Partitioning
Transients & Soft Errors
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DEADLINES
Presentation: April, 24th
Hotel: April, 20th
Registration: April, 20th
PhD Award: April, 1st
Abstract: Sep. 19th '10
PDF: Sep. 26th '10
Special S.: Oct. 8th '10
IP Sessions: Oct. 8th '10
Notification: Nov. 28th '10
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CONTACTS & FEEDBACK
For any questions you can contact the
VTS Office,
the General Chair or the
Program Chair.
Moreover, The VTS Organizing Committee is interested in providing a rich
historical view of VTS. Please send information you believe to be relevant
to the historian.
For questions related to this website, please contact the
Webmaster
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