The aim of the Third TTTC Doctoral Thesis Award is to promote and strengthen the interaction
between doctoral students who are about to graduate and the industrial community. More...
THE AIM OF THE THIRD TTTC DOCTORAL THESIS AWARD IS TO PROMOTE AND STRENGTHEN THE INTERACTION BETWEEN DOCTORAL
STUDENTS WHO ARE ABOUT TO GRADUATE AND THE INDUSTRIAL COMMUNITY.
It also serves as a process by which student work will be exposed to and tested under real life industrial needs by experts
in the field. This is achieved with student presentations in a conference environment in front of an industrial
panel that will have the chance to evaluate, comment and contribute to their work in terms of novelty and advance of industrial practice.
This is your chance to give your work and yourself visibility in the international test community!
Doctoral students who are expected to graduate in 2007 are invited to submit a one page abstract of their thesis
(maximum 700 words). As this will undergo blind review, please submit a separate cover page with the student name and affiliation,
the proposed title of the thesis, the expected date of graduation and an endorsement by the advisor
(or one of the advisors, in case of co-advisorship. That is, a simple letter with his name that s/he agrees with the nomination).
Important: In the actual title/abstract, do not include name and affiliation since it will undergo blind review.
Remember that the purpose of this contest is for the student to gain exposure and feedback from the industry.
Therefore, the abstract should clearly address the following three issues:
define the problem and its relevance to industry
describe existing industrial practices for solving the problem
explain your proposed methodology (and any case study) and how it advances theory/practice in the particular field.
In your abstract, you are allowed to have a second page only with references/figures.
This page does not count towards the 700 wordcount however you cannot self-reference or include any actual text past the
first page of the abstract.
The abstracts will be reviewed by a panel of industrial and academic specialists for the three issues outlined above.
A set of finalists will be selected for the final round of the contest. This round includes a five minute slot for oral presentation
and five minute Q&A/feedback slot, during a dedicated session at the IEEE VLSI Test Symposium (VTS'06),
Berkeley, CA on May 6-10. A panel of industrial specialists will judge the presentations, and the winner of the contest will
receive the "TTTC Doctoral Thesis Award". This award includes a honorarium and an invited publication of the presented
work in IEEE Design & Test!
This award is organized by the TTTC Students Activities Committee.
For more information, please contact Andreas Veneris at: tttc@eecg.toronto.edu
HOW TO APPLY
WHO: PhD level students expected to graduate in 2007
HOW: Submit a one page abstract for blind review and a cover letter that includes the endorsement of your
advisor as two different PDF files to tttc@eecg.toronto.edu
Address any inquires to the same email. The abstract needs to address the three issues outlined above, and emphasis will be given to
the advance of industrial practice as compared to current methodologies.
Deadline for abstract submission: February 28, 2007 Notification of winners for final VTS round: March 20, 2007
WHEN: Your abstract will be reviewed blindly, and if selected, you will be requested to present at
IEEE VTS'07 for the final round of the TTTC Doctoral Thesis Award!
LOCATION
VTS will take place from May 6th to May 10th, 2007 in Berkeley, California, USA More...
Moreover, The VTS Organizing Committee is interested in providing a rich
historical view of VTS. Please send information you believe to be relevant
to the historian.
For questions related to this website, please contact the
Webmaster
HOME 
CONTACTS 
