2007, May 7th

11:00-12:00   Sessions 1

Session 1A - RF Test I

Session 1B - Delay Test Quality

IP Session 1C -

Design in presence of variations: characterization, monitoring, and response

13:20-14:20    Sessions 2

Session 2A - Memory Test

Session 2B - Test Compression

IP Session 2C - Small Delay Test in Practice

14:40-15:40   Sessions 3

Session 3A - Going after Defects

Session 3B - Online Test

IP Session 3C - System Test and NTFs

16:00-17:00   Sessions 4

Session 4A - Diagnosis I

Session 4B - ATPG for Delay Faults

IP Session 4C - High-Speed Test

20:00-21:30   Sessions 5

Session 5A:

Embedded Tutorial - Statistical and Data Mining Methods for Test-Based Yield Learning

Session 5B: Panel - Conversations with Test Experts

2007, May 8th

08:30-09:30   Sessions 6

Session 6A - Advances in Test

Session 6B - Diagnosis II

IP Session 6C - Testing Alone Isn’t Enough: Reliability Challenges in Scaled CMOS

09:50-10:50   Sessions 7

Session 7A - Failure Estimation

Session 7B - Fault Prediction & Evaluation

Session 7C - Open and Highly Extendable Yield Diagnostics Solutions

11:10-12:10   Sessions 8

Session 8A - Analog Test

Session 8B - High Level Test Techniques

IP Session 8C - Impact of New Memory Failure Modes

13:45-15:15   Sessions 9

Special Session 9A:

Hot Topic - Fault Tolerant Nanoscale Architectures - the Challenges and Emerging Solutions

Session 9B - TTTC 2007 Best Doctoral Thesis Award

Special Session 9C:

Hot Topic - Making Analog & Mixed Signal Testing As Robust As Digital

2007, May 9th

09:00-10:00   Sessions 10

Session 10A - Memory Repair

Session 10B - SOC Test

10:20-11:20   Sessions 11

Session 11A - RF Test II

Session 11B - Design for Test

IP Session 11C - Collaborative DFT Practices Needed for Low-cost Testing

11:40-12:40   Sessions 12

Session 12A - Testing Large Chips

Session 12B - Ensuring Secure Chips

IP Session 12C:

Board and System Level Memory Cluster Test Problems and Proposed Solutions

14:00-15:30   Sessions 13

Special Session 13A:

New Topic - From asynchronous electronics to asynchronous molecular nanoelectronics

Session 13B: Hot Topic - Testing in the Presence of NOCs

Special Session 13C: Panel - RF Yield : Is it a problem?