Program at a glance
VTS 2023 technical program
08:50
Palm I/Palm II
KEYNOTE ADDRESS: Heterogeneous Integration in the AI Era
10:00
11:00
Belmont
Session 1A: Analog Test
Outlier Detection For Analog Tests Using Deep Learning Techniques
Speaker: Chin-Kuan Lin
Authors: Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua CHU, Kai-Chiang Wu, Mango Chao
Machine Learning-Based Adaptive Outlier Detection For Underkill Reduction In Analog/RF IC Testing
Speaker: Vineeth Niranjan
Authors: Vineeth Niranjan, Deepika Neethirajan, Dallas Webster, Amit Nahar, Constantinos Xanthopoulos, Yiorgos Makris
Architectural Radiation Hardening Of CMOS Power Management Circuits Through Bias Tuning
Speaker: Gauri Koli
Authors: Gauri Koli, Liam Nguyen, Jennifer Kitchen
Palm I
Session 1B: Failure Analysis
Gerabaldi: A Temporal Simulator For Probabilistic IC Degradation And Failure Processes
Speaker: Ian Hill
Authors: Ian Hill, Andre Ivanov
Diagnosis Of Quantum Circuits In The NISQ Era
Speaker: Yen-Wei Li (National Taiwan University)
Authors: Yu-Min Li, Cheng-Yun Hsieh, Yen-Wei Li, Chien-Mo LI
Targeted Custom High-Voltage Stress Patterns on Automotive Designs
Speaker: Saidapet Ramesh
Authors: Saidapet Ramesh, Jaiswal Akshay, Marchese Robert, Thota Sunny, Dickson Kristofor
Palm II
Session 1C: SS: Reliable Brain-inspired Hardware using Classical and Emerging Memories
Reliability Modeling of Emerging FeFET Technology
Speaker: Hussam Amrouch (U Stuttgart)
Robust and Efficient BNNs on Emerging Hardware
Speaker: Jian-Jia Chen and Mikail Yayla (TU Dortmund)
Neuromorphic Hardware with Memristive Devices
Speaker: Ahmedullah Aziz (Tennessee Knoxville, USA)
12:00
Palm I
Session 2A: IP - VLSI Functional Safety and RAS
Safety Mechanisms for Transient faults in Automotive - cost vs. effectiveness Speaker: Meirav Nitzan (Qualcomm)
Fault injection for automotive functional safety Speaker: Presenter: Ankush Sethi (NXP)
Managing Intermittent and Degrading Faults through Advanced Sensors, Analytics and Predictive Maintenance Speaker: Dan Alexandrescu (Synopsys)
Palm II
Session 2B: SS - Security verification & testing for SR Latch TRNGs
In silicon validation of SR-latch TRNG
Speaker: Jean-Luc Danger (Telecom Paris)
The impact of aging on SR-latch TRNG
Speaker: Naghmeh Karimi (UMBC)
Health tests in various certification schemes (NIST SP 800 90B, AIS BSI 31, OSCCA GM/T 0078)
Speaker: Sylvain Guilley (Telecom Paris & Secure IC)
Belmont
Session 2C: SS - Silent Error Corruption: Causes, Detection and Diagnosis
A Perspective on Silent Data Error Sources
Speaker: Sreejit Chakravarty (Intel)
Detecting Timing Marginalities that Cause Silent Data Errors
Speaker: Adit Singh (Auburn U)
Silent Error Modeling and Measurement Across the Layers
Speaker: Dimitris Gizopoulos (U Athens)
14:15
Belmont
Session 3A: Reliability
A Novel Lbist Signature Computation Method For Automotive Microcontrollers Using A Digital Twin
Speaker: Leon Klimasch
Authors: Daniel Tille, Leon Klimasch, Sebastian Huhn
Vmin Prediction Using Nondestructive Stress-Test
Speaker:
Authors: Chun Chen, Jeng-Yu Liao, Chien-Mo Li, Harry Chen, Eric Jia-Wei Fang
Predicting The Silent Data Error Prone Devices Using Machine Learning
Speaker: Mohammad Ershad Shaik
Authors: Mohammad Ershad Shaik, Abhishek Kumar Mishra, Yonghyun Kim
Palm I
Session 3B: Functional Test
Functional Test Generation For AI Accelerators Using Bayesian Optimization
Speaker: Arjun Chaudhuri
Authors: Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty
Expanding A Pool Of Functional Test Sequences To Support Test Compaction
Speaker: Irith Pomeranz
Authors: Irith Pomeranz
A Guided Debugger-Based Fault Injection Methodology For Assessing Functional Test Programs
Speaker: Francesco Angione
Authors: Francesco Angione, Paolo Bernardi, Nicola DI Gruttola Giardino, Davide Appello, claudia Bertani, Vincenzo Tancorre
Palm II
Session 3C: SS - JTAG: a family legacy
Nine years after its release, what is the future for 1687 ?
Speaker: Martin Keim (Siemens)
New frontiers for JTAG: Analog, Interfaces and System
Speaker: Jeff Rearick (AMD)
IEEE Std 1149.1 is being revised - what to expect?
Speaker: Heiko Ehrenberg
15:30
Palm I
Session 4A: IP - Silicon Lifecycle Management Challenges and Opportunities
Silicon health monitoring for automotive predictive maintenance Speaker: Robert Jin (NXP)
Hardware/Software Infrastructure to enable Silicon Monitoring throughout the IC Lifecycle Speaker: Nilanjan Mukherjee (Mentor/Siemens)
The need for End-to-end SLM Highway Speaker: Yervant Zorian (Synopsys)
Palm II
Session 4B: Embedded Tutorial
Hardware design and Reliability Mitigation of Binary Bayesian Reasoning Speakers: Lorena Anghel (Grenoble INP) and Mehdi Tahoori (KIT)
Belmont
Session 4C: SS - Approximation and Fault Resiliency of DNN Accelerators
GPU-Accelerated Framework for DNN Approximation Exploration
Speaker: Alberto Bosio (INL - École Centrale de Lyon)
Harnessing Approximation for Fault Injection in DNN Accelerators
Speaker: Maksim Jenihhin (Tallinn University of Technology)
Fault resiliency in DNNs
Speaker: Ernesto Sanchez (Politecnico di Torino)
09:00
10:00
Belmont
Session 5A: BIST and DFT Based Test Generation
Fully Deterministic Storage Based Logic Built-In Self-Test
Speaker: Subashini Gopalsamy
Authors: Subashini Gopalsamy, Irith Pomeranz
Test Generation For Defect-Based Faults Of Scan Flip-Flops
Speaker: Yu-Teng Nien
Authors: Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango Chao
Design For Testability (DFT) For RSFQ Circuits
Speaker: Mingye Li
Authors: Mingye Li, Yunkun Lin, Sandeep Gupta
Palm I
Session 5B: HW Security
CAPEC: A Cellular Automata Guided FSM-Based IP Authentication Scheme
Speaker: Farimah Farahmandi
Authors: Mridha Md Mashahedur Rahman, Mohammad Rahman, Rasheed Kibria, Mike Borza, Bandi Reddy, Adam Cron, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi
A Low Overhead Checksum Technique For Error Correction In Memristive Crossbars For Deep Learning Applications
Speaker: Mehdi B Tahoori
Authors: Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Mãœnch, Mehdi Tahoori
Thwarting Reverse Engineering Attacks Through Keyless Logic Obfuscation
Speaker: Leon Li
Authors: Leon Li, Alex Orailoglu
Palm II
Session 5C: SS - Graph Neural Networks for Design, Security, and Trust
Fault Criticality-aware GNN Training on ReRAM-based Processing-in-Memory Systems
Speaker: Partha Pande (Washington State U)
Graph Neural Networks for Hardware Vulnerability Analysis - Can you Trust your GNN?
Speaker: Lilas Alrahis (NYUAD)
Using GNNs for Tier-Level Fault Localization in Monolithic 3D Ics
Speaker: Krishnendu Chakrabarty (ASU)
11:45
Belmont
Session 6A: SS - Tuning Memory Test Challenges and Solutions for Advanced Tech Nodes
An Efficient External Memory Test Solution: Case Study for HPC Application
Speaker: Gurgen Harutyunyan (Synopsys)
Authors: Keqing Ouyang (ZTE/Sanechips), Minqiang Peng (ZTE/Sanechips), Yunnong Zhu (ZTE/Sanechips), Kang Qi (ZTE/Sanechips), Grigor Tshagharyan (Synopsys), Arun Kumar (Synopsys), Gurgen Harutyunyan (Synopsys), Isaac Wang (Synopsys)
Allocating Physically Aware Embedded Memory Test & Repair Processor using Floorplan Info at the RTL Design Level
Speaker: Raj Chudasama
Authors: Vinay Kumar (Intel), Raj Chudasama (Intel), Bin BW Wang (Intel), Manish Arora (Synopsys), Bharath Shankaranarayanan (Synopsys)
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era
Speaker: Gurgen Harutyunyan
Authors: Artur Ghukasyan (Synopsys), Grigor Tshagharyan (Synopsys), Gurgen Harutyunyan (Synopsys), Yervant Zorian (Synopsys)
Palm II
Session 6B: Embedded Tutorial
Hardware Efficient Binary Neural Network Architectures
Speaker: Ahmet Enis Cetin (UIC)
Palm I
Session 6C: IP - Innovation on Telemetry Monitoring
Elevating Die-To-Die Interface Testing and Repair with On-die Diagnosis
Speaker: Marc Hutner (ProteanTecs)
Application of On-Chip Monitors to Improve Quality and Functional Safety
Speaker: Chen He (NXP)
How Silicon Observability Enables Prescriptive Maintenance
Speaker: Sashi Obilisetty (Synopsys)
09:15
Belmont
Session 7A: Post Silicon Validation and Memory Test
Kernel Smoothing Technique Based On Multiple-Coordinate System For Screening Potential Failures In NAND Flash Memory
Speaker: Gooyoung Kim
Authors: Gooyoung Kim, Youngseon Moon, Jongmin Kim
Pre And Post Silicon Server Platform Transient Performance Using Trans-Inductor Voltage Regulator
Speaker: Ritchie Rice (Intel)
Authors: Judy Amanor-Boadu, Rishik Bazaz, Ritchie Rice, Azizi Shuma, Horthense Tamdem
Auxiliary State-Machine Controlled Autonomous Design Verification Framework
Speaker: Navaneeth Kumar (TI)
Authors: Gurumurti Avhad, Navaneeth Kumar, Shitin Sahu
Spiking Neural Networks accelerators in traditional CMOS technologies
Speaker: Alessio Carpegna
Augmented silicon photonics platforms for neuromorphic accelerators
Speaker: Fabio Pavanello
Design and Reliability Considerations of Emerging Memory-based SNNs
Speaker: Stefano Di Carlo
Palm I
Session 7C: IP - Chiplet: Design, Assembly and Test
The New Open Chiplet Economy Speaker: Bapi Vinnakota (Lawrence Berkeley Labs)
Multi-Die Stack Assembly and Interconnects Speaker: Jaber Derakhshandeh (IMEC)
Standardizing Chiplet Interconnect Test Speaker: Sreejit Chakravarty (Intel)
13:00
Palm II
Session 8A: Test Generation
Effective And Efficient Testing Of Large Numbers Of Inter-Die Interconnects In Chiplet-Based Multi-Die Packages
Speaker: Po-Yao Chuang (NTHU / imec / Cadence)
Authors: Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Cheng-Wen Wu, Georges Gielen, Erik Jan Marinissen
An Exploration Of ATPG Methods For Redacted Ip And Reconfigurable Hardware
Speaker: Jackson Fugate
Authors: Greg Stitt, Naren Vikram Raj Masna, Venkata Kalluru, Swarup Bhunia, Nij Dorairaj, David Kehlet
Compact Set Of Functional Broadside Tests With Fault Detection On Primary Outputs
Speaker: Irith Pomeranz
Authors: Irith Pomeranz
Palm I
Session 8B: IP - Testability and Dependability of GPU, HPC and Autonomous Systems
AWPERA: ATPG-Aware Observation Point Insertion using Graph Convolutional Networks Speaker: Arjun Chaudhuri (nVidia)
Application-Driven Target Setting, Fault Impact and High-Performance Computing and Machine Learning Resiliency
Speaker: Michael Paulitsch (Intel)
The safety challenges of deploying autonomous vehicles - from the chip perspective
Speaker: Eric Zhang (Untether AI)
14:00
Palm II
Session 9A: SS - CAD for Security
SoC Security Verification: Challenges and Solutions
Speaker: Farimah Farahmandi (UFL)
Harnessing pre-silicon simulation to detect and root-cause side-channel leakage
Speaker: Nicole Fern, Jasper van Woudenberg, or Rajesh Velegalati
An Intermediate Representation for Hardware Security Verification
Speaker: Ryan Kastner (UC SanDiego)
Palm I
Session 9B: IP - Unified Approaches to Silicon Debug
Scan and Embedded Memory State Extraction for Silicon Debug, Validation, and Analysis Speaker: Mike Ricchetti (Synopsys)
Platform-level observability of SoC Scan and Array Functional states for System and In-Field Debug Speaker: Sankaran Menon (Intel)
Use-cases and ROI for unified verification, test and silicon debug sequences using Design-for-Verification Speaker: David Akselrod (AMD)