Sunday, April 9, 2017
VTS’17 is offering 2 half-day TTEP tutorials, one in the morning and one in the afternoon, for which a separate registration fee is required. Attendees who register for the tutorials may select either one or both of the offerings. Registration includes a hard copy of the tutorial material, breakfast, coffee breaks and lunch. The two tutorials are listed below:
Morning Tutorial (8:30a.m.–12:00p.m.)
Title: Mixed-signal DFT & BIST: Trends, Principles, and Solutions
Presenter: Stephen Sunter (Mentor Graphics)
The lack of automated analog DFT means that analog circuitry accounts for the vast majority of failures in today’s automotive mixed-signal ICs. This tutorial strives to improve this situation. We first review trends in ad hoc DFT and fault simulation, IEEE DFT standards 1149.1, .4, .6, .7, .8, P1149.10, and 1687, and the advent of ISO 26262. The trend analysis concludes with a review of BIST techniques for ADC/DAC, PLL, SerDes/DDR, and random analog. Next, seven essential principles of practical analog BIST are presented that include, for instance, addition, subtraction, and specification-based structural test. Lastly, we discuss practical DFT techniques, ranging from quicker analog defect coverage/tolerance simulation and DFT simplification, to oversampling and undersampling methods that greatly improve range, resolution, and reusability; concluding with an automatable general mixed-signal DFT strategy being developed by engineers from a dozen companies for a future IEEE standard.
Afternoon Tutorial (1:00p.m.–4:30p.m.)
Title: Automotive Reliability & Test Strategies
Presenter: Yervant Zorian (Synopsys)
Given today’s fast growing automotive semiconductor industry, this tutorial will discuss the implications of automotive test, reliability and functional safety requirements on all aspects of the SOC lifecycle: design, silicon bring-up, volume production, and particularly in-system functional safety. Today’s automotive safety critical chips need multiple in-system self-test modes, such as power-on self-test and repair, periodic in-field self-test, advanced error correction, etc. This tutorial will cover these specific in-system modes and the benefits of selecting ISO 26262 certified solutions to ensure standardized functional safety requirements, while accelerating time to market for automotive SOCs.
To register to the tutorials please visit the Registration page.