HOME     CONTACTS  
GENERAL INFO THE SYMPOSIUM PRACTICAL INFO PROGRAM SUBMISSIONS


Graduate Student Activities
The TTTC Student Activities Committee is organizing two activities aiming to provide graduate students with an opportunity to disseminate their research and obtain visibility in the international test community. More...

TTEP
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics are also offered.

VTS - April 19th - April 22nd, 2010

VTS Booklet available here


The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2010. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.


PROGRAM CHAIRS

Michel Renovell
LIRMM - CNRS
renovell@lirmm.fr

Claude Thibeault
École de Technologie supérieure
claude.thibeault@etsmtl.ca

 GENERAL CHAIR

Magdy Abadir
Freescale Semiconductor
m.abadir@freescale.com
Corporate Supporters
Please visit our CORPORATE SUPPORTERS

Logo of each sponsor is owned by the sponsoring company
Sponsors
VTS Topics
Major topics include, but are not limited to:
  • Analog, Mixed-Signal & RF Test
  • ATPG & Compression
  • ATE Architecture & Software
  • Board & System Test
  • Built-In Self-Test (BIST)
  • Current Based Test
  • Defect/Fault Tolerance & Self-Repair
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Diagnosis and Debug
  • Embedded System and Microsystems Test
  • Embedded Test Methods
  • FPGA Test
  • Fault Modeling and Simulation
  • Infrastructure IP
  • Low-Power IC Test
  • MEMS And Sensor Test
  • Memory Test and Repair
  • Emerging Technologies Test
  • On-Line Test
  • Power Issues in Test
  • System-on-Chip (SOC) Test
  • System-in-Package Test
  • Standards
  • Test Economics
  • Thermal Test
  • Test of Biomedical Devices
  • Test of High-Speed I/O
  • Test Quality and Reliability
  • Test Resource Partitioning
  • Transients & Soft Errors
    •  
    DEADLINES
  • Early Reg.: Apr. 2nd, 10
  • Camera R.: Feb. 13th '10
  • Abstract: Sep. 20th '09
  • PDF: Sep. 30th '09
  • Notification: Dec. 4th '09
  • IP Tracks: Nov. 30th '09
  • Spec. Sess.: Nov. 30th '09

       

    • CONTACTS & FEEDBACK

    For any questions you can contact the VTS Office, the General Chair or the Program Chairs.

    Moreover, The VTS Organizing Committee is interested in providing a rich historical view of VTS. Please send information you believe to be relevant to the historian.

    For questions related to this website, please contact the Webmaster


    Home    |    The Symposium    |    Program    |    Past Events    |    Authors/Reviewers

    For questions related to this website, please contact the Webmaster